Mars 4400 is a dislocation detection device for SiC wafers after corrosion. The device adopts optical microscopy imaging technology with differential interference difference, which can perform full image scanning and collect complete data, calculate and automatically calculate the number and density of dislocations, and generate dislocation density maps.
Product parameters:
Application scope: Analysis of dislocation detection after SiC wafer corrosion
Measurable chip size: Supports 6 and 8 inches
Film transmission method: Manual loading and unloading
Contact:
Company Email：service@zdkfh-ie.com
Contact Number：0351--6523746
