On March 30-31, 2023, CEC Fenghua presented its Sic wafer defect inspection technology solution at the 2nd 3rd Generation Semiconductor Materials Technology and Market Seminar, attracting much attention.
In order to meet the urgent needs of the domestic semiconductor industry for defect detection equipment, the company insists on independent innovation to build a domestic semiconductor inspection equipment business card, forming the mass production and technical support capacity of the whole machine, which is now applied to many domestic customers, helping to promote the process of domestic substitution.
In the future, CEC Fenghua will continue to increase innovation and development in the field of semiconductor technology, provide customers with competitive products and technical solutions, and escort the independent and controllable development of China's third-generation semiconductor industry!
